Unifying frequency metrology across microwave, optical, and free-electron domains
Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg
Fig. 3, panel (a)
Deviation (meV) of the calibration markers at multiples of the photon energy from the nominal spectrometer energy, against pixel (px), for Exposures 1 (blue) and 2 (orange). Shaded bands are the error bars. The printed inset schematic is not drawn.
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- Data: data.csv
Provenance
This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.
License: CC BY 4.0.
Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486
Other panels of Fig. 3: (b) (c) (d) (e)
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