Unifying frequency metrology across microwave, optical, and free-electron domains
Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg
Fig. 3, panel (e)
Histogram (counts, 25 bins) of the pixel-wise root-mean-square deviation (meV) between the energy solutions of the two exposures, with the normal distribution fit drawn as a red curve, as labelled in the panel.
Files
- Data: data.csv
- Overlay (normal fit ($\sigma$ = 20.9 meV)): overlay.csv
Provenance
This panel was regenerated by running the authors' plotting code and data from their public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.
License: CC BY 4.0.
Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486
Other panels of Fig. 3: (a) (b) (c) (d)
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