Unifying frequency metrology across microwave, optical, and free-electron domains
Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg
Fig. 4, panel (b)
First-order component (eV) of the polynomial fit of the energy solution (pixel-to-energy mapping) against pixel (px) for the four calibrations, coloured as in (a); the legend gives the calibrated average dispersion of each.
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Provenance
This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.
License: CC BY 4.0.
Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486
Other panels of Fig. 4: (a) (c) (d)
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