Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang; Paolo Cattaneo; Arslan S. Raja; Bruce Weaver; Rui Ning Wang; Alexey Sapozhnik; Fabrizio Carbone; Thomas LaGrange; Tobias J. Kippenberg

doi:10.1038/s41467-025-62808-5

Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg

2025Nature Communications 16, 8369CC BY 4.0LCP000087

Fig. 4, panel (c)

Pre-calibration error (THz) in the optical frequency measured from the electron spectra against optical frequency $f_{\mathrm{opt}}$ (THz), before calibrating the spectrometer (nominal pixel-to-energy mapping), one point per calibration coloured as in (a), with error bars.

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This panel was regenerated by running the authors' plotting code and data from their public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.

License: CC BY 4.0.

Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486

Other panels of Fig. 4: (a) (b) (d)

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