Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang; Paolo Cattaneo; Arslan S. Raja; Bruce Weaver; Rui Ning Wang; Alexey Sapozhnik; Fabrizio Carbone; Thomas LaGrange; Tobias J. Kippenberg

doi:10.1038/s41467-025-62808-5

Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg

2025Nature Communications 16, 8369CC BY 4.0LCP000087

Fig. 2, panel (b)

Microwave power spectrum (dBm) against microwave frequency (MHz) recorded with the electronic spectrum analyzer (RBW 5 kHz) with the optical phase-locked loop off (Unlocked). The printed labels of the repetition-rate peak $f_{\mathrm{rep}}$ and the four beatnotes $f_{\mathrm{beat},1}$ to $f_{\mathrm{beat},4}$ are not drawn.

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This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.

License: CC BY 4.0.

Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486

Other panels of Fig. 2: (b-inset) (c) (d) (d-inset)

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