Unifying frequency metrology across microwave, optical, and free-electron domains
Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg
Fig. 2, panel (d-inset)
Inset of panel (d): the same four spectra in the shaded central window, normalized electron counts (arb. u.) against electron energy minus 120 keV (eV); raw (gray), pre-filtered (black), deconvolved (green) and un-modulated (light green shaded). The printed inset has no tick labels.
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Provenance
This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.
License: CC BY 4.0.
Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486
Other panels of Fig. 2: (b) (b-inset) (c) (d)
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