Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang; Paolo Cattaneo; Arslan S. Raja; Bruce Weaver; Rui Ning Wang; Alexey Sapozhnik; Fabrizio Carbone; Thomas LaGrange; Tobias J. Kippenberg

doi:10.1038/s41467-025-62808-5

Unifying frequency metrology across microwave, optical, and free-electron domains

Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg

2025Nature Communications 16, 8369CC BY 4.0LCP000087

Fig. 2, panel (d)

Normalized electron counts (arb. u.) against electron energy minus 120 keV (eV) at the nominal EELS dispersion of 50 meV/px: raw spectrum (gray), spectrum smoothed with a Gaussian pre-filter (black), deconvolved spectrum (green), and the spectrum without optical modulation (light green shaded). The shaded window marking the inset region is not drawn.

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This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.

License: CC BY 4.0.

Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486

Other panels of Fig. 2: (b) (b-inset) (c) (d-inset)

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