Unifying frequency metrology across microwave, optical, and free-electron domains
Yujia Yang, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, Tobias J. Kippenberg
Fig. 2, panel (c)
Optical power spectrum (dBm) against optical frequency (THz) recorded with the optical spectrum analyzer (RBW 0.02 nm): the narrow CW laser peak at $f_{\mathrm{opt}}$ on the plateau of the bandpass-filtered optical frequency comb.
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Provenance
This panel was reproduced from the authors' public data deposit (Zenodo: https://doi.org/10.5281/zenodo.16600739, CC BY 4.0). The plot shown here is re-rendered for interactive viewing and analysis. See the paper for the original figure and full scientific context.
License: CC BY 4.0.
Nat. Commun. 16, 8369 (2025) · DOI: 10.1038/s41467-025-62808-5 · arXiv: 2403.10486
Other panels of Fig. 2: (b) (b-inset) (d) (d-inset)
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